Landing: 11f59ab65c27

Project / Subsystem

gcc / testsuite

Date

2026-07-14

Author

Torbjörn SVENSSON

Commit

11f59ab65c277af9d354d158cc996dbbd3d43a2b

Source

github

Perf win

No

Breaking

No

All attributes

project
gcc
subsystem
testsuite
patch_id
commit_hash
11f59ab65c277af9d354d158cc996dbbd3d43a2b
source_type
github
headline
ARM test suite: Removed expected failures for MVE, NEON, thumb1.
tldr
Test suite correctly passes tests for ARM MVE, NEON, and thumb1, so xfail markers were removed.
author
Torbjörn SVENSSON
outcome
committed
performance_win
false
breaking_change
false
series_id
series_parts
[]
tags
  • arm
  • testsuite
  • compiler
discussion_id_link
bugzilla_pr
date
2026-07-14T00:00:00.000Z

This commit removes the xfail (expected failure) markers from several tests in the ARM section of the GCC testsuite. These tests, related to string operation overflow warnings and PR97027, were previously marked as expected failures on targets with MVE, NEON, or thumb1 support. The tests now pass correctly on these configurations, indicating that the underlying issues have been resolved or the tests are behaving as expected.