Landing: a0f7c857279a
Project / Subsystem
gcc / gcc/testsuite
Date
2026-07-16
Author
Iain Sandoe
Commit
a0f7c857279aa4f2830b65813b9ed68d9fa9098d
Source
github
Perf win
No
Breaking
No
All attributes
- project
- gcc
- subsystem
- gcc/testsuite
- patch_id
- —
- commit_hash
- a0f7c857279aa4f2830b65813b9ed68d9fa9098d
- source_type
- github
- headline
- aarch64: Remove redundant big-endian Neon tests.
- tldr
- Big-endian AArch64 Neon tests are removed from the testsuite driver to avoid duplication.
- author
- Iain Sandoe
- outcome
- committed
- performance_win
- false
- breaking_change
- false
- series_id
- —
- series_parts
- []
- tags
-
- • aarch64
- • neon
- • testing
- discussion_id_link
- —
- bugzilla_pr
- —
- date
- 2026-07-16T00:00:00.000Z
This commit removes a section from the aarch64-neon.exp test driver script that caused tests to be re-run specifically for big-endian execution. Since most targets are little-endian and cannot perform these tests, re-running them on big-endian systems only served to duplicate effort. Removing this section streamlines the test execution for AArch64 Neon tests.